satya_422
Member level 3
Re: DFT question
yaa its good question :
data volume = no of channels* scanchain length * no of patterns
test cycles = scanchain length * no of patterns
test time = scanchain length * no of patterns * 1/frequency
scan chain length = no of scan cell/no scan chains
so if the length increases the time to shift increases
then the test volume increase.
then the test time increases
vlsitechnology said:How can the use of more scan chains reduces testing time very much.
yaa its good question :
data volume = no of channels* scanchain length * no of patterns
test cycles = scanchain length * no of patterns
test time = scanchain length * no of patterns * 1/frequency
scan chain length = no of scan cell/no scan chains
so if the length increases the time to shift increases
then the test volume increase.
then the test time increases