e.Horus
Junior Member level 3
Hello,
I need some urgent help. I am using an online calculator for one of the main CMOS foundaries
in the world. My objective is to determine the life time of a circuits under differnt voltage and
temperature conditions. The problem is that I do not understand some of these terms (which
they ask for) and I also have an additional couple of questions:
For the purpose of Hot carrier injection:
1. What is Tj (junction temperature) is it the sme as the operating temperature? If so why is it that the life time decreases when I enter a lower Tj?
3. what is DC to AC factor?
4. what is cum. fail?
For the purpose of Gate oxide break down;
If I apply the voltage to the gate of a common source and the same voltage to the source of
a common-gate device, which has a higher risk of oxide breakdown?
Thank you greatly for your help
I need some urgent help. I am using an online calculator for one of the main CMOS foundaries
in the world. My objective is to determine the life time of a circuits under differnt voltage and
temperature conditions. The problem is that I do not understand some of these terms (which
they ask for) and I also have an additional couple of questions:
For the purpose of Hot carrier injection:
1. What is Tj (junction temperature) is it the sme as the operating temperature? If so why is it that the life time decreases when I enter a lower Tj?
3. what is DC to AC factor?
4. what is cum. fail?
For the purpose of Gate oxide break down;
If I apply the voltage to the gate of a common source and the same voltage to the source of
a common-gate device, which has a higher risk of oxide breakdown?
Thank you greatly for your help