Missing from the description, is whether this is confined to
the batch of "bad" boards or whether the "fuzz" now also
appears on boards that formerly tested "good" and "fuzz
free" on the bench.
There has to be the possibility that the "bad" boards are
"bad" because of some internal EMI aggressor, as well as
the possibility of an internal 'scope fault. Which ought to
be testable by finding another 'scope to plug the butt end
of the presently attached probes, to.
Boards might (say) have a different vendor's decoupling
caps with inferior ESR/ESL; might be missing a ground
jumper connecting your test point adjacent ground post
to the real ground plane; might include an unfortunate
design revision. All that kind of thing. You have to figure
out some "cut-planes" across the various dimensions of
failure, to get to a tractable problem-space. For starts
that could be two of everything, not from the same batch
any of it, and proceed with the matrix of observations as
you plug, and play.