xiongdh
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___It is said Boundary-scan testing can be used to test the core logic functionality of a device or the interconnect structure between device in Boun*dary Sc*an Refe*rence Ma*nual of Syn*ops*ys.
___But in the book "design-for-test for digital IC's and Embedded Core systems" and the document "design for test,Semiconductor Reuse Standard" of motorola,BSD is not included.Why?
___In many document,BSD is introduced as a test method of PCB for the packeted IC and interconnect test.
___Is the BSD not used mostly in embedded core design for core test.Can someone give detail about the benefit and harm of BSD used in ASIC DFT design? better with compare to other DFT technology such as SCAN and BIST.
___But in the book "design-for-test for digital IC's and Embedded Core systems" and the document "design for test,Semiconductor Reuse Standard" of motorola,BSD is not included.Why?
___In many document,BSD is introduced as a test method of PCB for the packeted IC and interconnect test.
___Is the BSD not used mostly in embedded core design for core test.Can someone give detail about the benefit and harm of BSD used in ASIC DFT design? better with compare to other DFT technology such as SCAN and BIST.