PMOS(PNP) typically has a lower intrinsic ESD performance. Because the snapback voltage is closer to the 'trigger' voltage multiple PMOS fingers and/or blocks can share the ESD current. The NMOS(NPN) has intrinsicly a higher ESD performance but for multifinger devices very often the ESD current is not uniformly spread along the device fingers. The snapback holding voltage is much lower for the (more efficient) NPN device.
Numbers range from 2-3mA/um for PMOS devices to 5-10mA/um for NMOS structures. The numbers tend to lower at more advanced technology and could be as high as 15mA/um for really mature technology such as 0.35um or older.
If you use certain techniques such as adding ballast resistance to the drains of the NMOS fingers you can ensure better current uniformity and hence better total ESD performance.
This is the basic story for mature and advanced node. However, in HV technology it happens a lot that the NMOS does not 'survive' snapback behavior while PMOS devices can tolerate PNP action longer.
Hope this helps!