Variability, Reliability, DFM, DFY

Hello,

I need some references please about : Variability, Reliability, DFM, DFY,etc. (about the deep-submicron effects related to scaling in general)

books, articles, papers, tutorials, website...!


Thanks,
Salma

i am attaching some material for the variability and substrate noise......

all the terms are interrelated only, related to yield enhancement fo rtechnology nodes higher than 180nm...........this yield issue comes in picture as for nodes higher than 180nm systemetic and parametric defects become dominant.......
you can even search on some universities websites.

for any specific issue or second order effect you can mail back.
hope this helps you.......

Thanks, but there's nothing attached...

I just need to know about these concepts in general, without entering into details, cause it'll be somehow related to my future work....

Thanks,
Salma

hi
i tried loading the files but was not able to load them, till then you can just surf these links and books.....these will surely give you some idea about the DFM and second order effects......


Y. Chen, A. B. Kahng, G. Robins and A. Zelikovsky, “Practical Iterated Fill Synthesis for CMP Uniformity", Proc. Design Automation Conf., June 2000, pp. 671-674.

Zhan Chen and Israel Koren,” Layer Reassignment for Antenna Effect Minimization in 3-Layer Channel Routing” Proceedings of the Workshop on Defect and Fault-Tolerance in VLSI Systems (DFT),jan 1996,pp 77 – 85.

Jon Wilkening,” Grain Boundary Diffusion due to Stress and Electromigration”,
Courant Institute of Mathematical Sciences July 20,2004,pp 1 – 48.
Chin-Chi Teng, Yi-Kan Cheng, Elyse Rosenbaum, and Sung-Mo Kang,” Hierarchical

Electromigration Reliability Diagnosis for VLSI Interconnects”, journals of 33rd Design Automation Conference,las vagas,NV,USA 1996,pp 3 – 23.

Neil H.E. Weste & Kamran Eshraghian,”Principle of CMOS Design”,Pearson Education second Edition,2002,pp 109-464.

E.Fujishin,K.Garret,M.P.Louis,R.F.Motta, & M.D.Hartranft,”Optimized ESD protaction circuits for high speed MOS/VLSI,”IEEE proceedings of custom Integrated Circuits Conference,May 1984,pp. 569-573

Takayasu Sakurai,Kazutaka Nogami,Masakazu Kakumu,and Tetsuya lizuka,”Hot Carrier generation in submicrometer VLSI environment,”IEEE JSSG,vol.SC-20,no.2,Apr.1985,pp. 531-536