Welcome to our site! EDAboard.com is an international Electronics Discussion Forum focused on EDA software, circuits, schematics, books, theory, papers, asic, pld, 8051, DSP, Network, RF, Analog Design, PCB, Service Manuals... and a whole lot more! To participate you need to register. Registration is free. Click here to register now.
use internal look back test ..
digital send out USB singal and receive from anoth PHY
chipset have many USB port ..
you can not check eye pattern in MASS production ..
for USB 1.1 PHY
standard IO test .. USB 1.1 very slow ..
and we don't check Tr/Tf or cross-point by Mass production
This site uses cookies to help personalise content, tailor your experience and to keep you logged in if you register.
By continuing to use this site, you are consenting to our use of cookies.