Sergoi
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Hi folks.
I have single port memory with a dedicated test clock port, i.e. in *.lvlib for clock port:
there are also select for CLK/TCLK in *.lvlib
Moreover, separate test clock port (MBIST_CLK) must be present in design, i.e. it is impossible to use functional clock(FUNC_CLK) for mbist. Required mbist config is like this (without memory interfaces/collars for simplicity):
I'm using tshell, not LV. So, i'm add_clock to 'TCLK' and add_dft_clock_mux for 'CLK' 'TCLK' with 'all_test' as a dft control signal. But at the check_design_rule stage i have a DFT_C1-1 error "Memory clock not properly sourced by a declared clock". Aslo i'v tried to use add_dft_control_points and other ways, like add single pseudo port for both CLK and TCLK, to solve this problem, but it's all fails, DFT_C1-1 error staying.
Does anyone knows how to use separate test mbist clock for testing memories with internal mux on clock port?
I have single port memory with a dedicated test clock port, i.e. in *.lvlib for clock port:
Code:
Port (CLK)
{
Direction: INPUT;
Function: Clock;
Plarity: ActiveHigh;
EmbeddedTestLogic {
TestInput: TCLK;
}
}
Code:
Port (TCLKE)
{
Direction: INPUT;
Polarity: ActigeHigh;
Function: BistEn;
}
Moreover, separate test clock port (MBIST_CLK) must be present in design, i.e. it is impossible to use functional clock(FUNC_CLK) for mbist. Required mbist config is like this (without memory interfaces/collars for simplicity):
I'm using tshell, not LV. So, i'm add_clock to 'TCLK' and add_dft_clock_mux for 'CLK' 'TCLK' with 'all_test' as a dft control signal. But at the check_design_rule stage i have a DFT_C1-1 error "Memory clock not properly sourced by a declared clock". Aslo i'v tried to use add_dft_control_points and other ways, like add single pseudo port for both CLK and TCLK, to solve this problem, but it's all fails, DFT_C1-1 error staying.
Does anyone knows how to use separate test mbist clock for testing memories with internal mux on clock port?