Stuck-at Faults vs Transition Faults

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kashyapgohel

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In TDF, we are doing at-speed testing, which will be on chip's functional frequency. As chip is going to function at this frequency only, why we are doing stuck at ?..what is the significance of stuck at fault as all the STR and STF faults are going to cover at chip's frequency in TDF model.
 

Because SAF are a well plowed road and low speed functional pattern
is easy to implement at initial test (probe) while at-speed has to wait
for a well designed packaged test solution (and so taking any DC-
compromised parts further through the value-add-chain before you
send them, where you should've known they were headed?).
 

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