Read:
1. Digital systems testing and testable design by Miron Abramovici
2. Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits by Michael Lee Bushnell and Vishwani D. Agrawal
You can use an ATPG (Automatic Test Pattern generation) tool to generate the input sequence (test patterns).
Eg : Tetramax (Synopsys), Fastscan (Mentor Graphics)
@Tushar : Note its "stuck-at" fault not "struck-at"