Good afternoon, dick_freebird! I really appreciate both of your responses. To be honest, I am not entirely sure what do you mean by the sentence: "A thing to look at, is whether the S, D diodes have any model properties populated, and whether individual devices have junction area and periphery props set, to scale them for C and (you wish) leakage." Can you please explain in little bit more detail what do you mean by that? As you mentioned, the I-V characteristics are the first thing I haven taken a look at even before testing this very circuit. (To be honest these ones I tested for gpdk090 and not for this one). They look a the one I would expect yo see from a short-channel devices.Again, these are fake (non-silicon, just how "real" when there's nothing to "fit"?) devices / models, right? I advised a closer look at FET I-Vs to see if the problem is "from above".
A thing to look at, is whether the S, D diodes have any model properties populated, and whether individual devices have junction area and periphery props set, to scale them for C and (you wish) leakage. Also, a realistic FET will have channel leakage from the surface states (NFS in older models, dunno what yours look like). If your sub threshold slope looks "too good to be true" then maybe it is.
Thank you, Dominik, for your response! You are absolutely right regarding the CM connection - I was just stacking on transistors for this technology to see if Spectre gives any reasonable dc op for the analysis. That might actually be a problem which is sometimes really hard to detect when one focuses on the cascode but not the basics. However, I can not really agree on two other notices regarding the circuit. Yes, transistors are biased by voltage rather then a current. The reason comes from the previous thread. The voltages I have peaked up has been generated through a successfully-tested beta-ratio multiplier for gpdk090. The sizing for the other technology, as well as bias voltages and supply stays the same. I do not want to say that I would expect 45nm tech behave the same as 90nm even with the same sizing - just to troubleshoot the error in spectre or model files by switching to the other technology. Regarding the third bullet point I would rather partially agree then disagree. The reason for that is that I would like to see the open loop gain of the opamp first before putting in in a feedback configurations. Even though open-loop gain is tested by stb analysis for a fully-differential configuration, which is the case for me, the first thing to do before starting on checking the specs is a simple dc op, which, again, I have been trying to do here. I would like to see some reasonable overdrive across all the devices in cascode and the output slopes to get a zero-order's estimation for the gain. Or have you meant the common-mode feedback?All above means it is not working and it is normal behavior.
- There is no proper connection in current mirror
- Transistors are biased by voltage
- The circuit is suppose to be a high gain OTA, while no feedback is present.
MOSFETs are biased by current through current mirror. This is the only way to bias any MOSFET properly. Even simplest CS amplifier has to be biased by current through current mirror, while signal is DC blocked. By voltage, you can bias BJT not MOSFET.Yes, transistors are biased by voltage rather then a current.
It is not possible to get OL gain with no feedback configuration as OTA cannot be biased in proper operating point.The reason for that is that I would like to see the open loop gain of the opamp first before putting in in a feedback configurations.
Again, with no feedback (both differential and CMFB) you cannot expect any results. The input range of differential pair is around 50mV (depending to it OP). With 80dB OL Gain you have to set differential voltage between inputs with 1µV accuracy only because of gain. Any difference will strongly affect current in both OTA branches results in different OP of OTA transistors. You can play like this for long time getting nothing valuable.the first thing to do before starting on checking the specs is a simple dc op, which, again, I have been trying to do here. I would like to see some reasonable overdrive across all the devices in cascode and the output slopes to get a zero-order's estimation for the gain.
That makes sense. I am completely agree that transistors should be biased with a curret rather then a voltage. However, I am not really sure if that makes a difference for the simulator. Please correct me if I am wrong: When a current is passing through a diode-connected device, it generates the gate-source voltage needed for this device to maintain the same current; thereafter this gate-source voltage can be applied to the gate of the other device one can expect the second transistor to reproduce the mentionedd current. The voltages I am applying to the gates were previously generated by this circuit, which has been successfully tested.MOSFETs are biased by current through current mirror. This is the only way to bias any MOSFET properly. Even simplest CS amplifier has to be biased by current through current mirror, while signal is DC blocked. By voltage, you can bias BJT not MOSFET.
It is not possible to get OL gain with no feedback configuration as OTA cannot be biased in proper operating point.
Again, with no feedback (both differential and CMFB) you cannot expect any results. The input range of differential pair is around 50mV (depending to it OP). With 80dB OL Gain you have to set differential voltage between inputs with 1µV accuracy only because of gain. Any difference will strongly affect current in both OTA branches results in different OP of OTA transistors. You can play like this for long time getting nothing valuable.
Do things in proper way. You are getting errors in simulations not because something is wrong with gpdk (both gpdk090 and 45 are mature and well tested even if they are not real process) or simulator, but because testbench is wrong.
Start from single ended version in unity gain configuration. Then expand it to fully differential.
Good afternoon, Dominik and thank you for your reply! Yes, the supply connections have been messed up. I changed all of them to global ones which can be seen from the netlist. This time I extracted the whole oneAttached netlist is incomplete.
You are using global nets in subcircuit but not on the top level, so there is no supply connection in the instance I10. At least according to attached screenshots.
Something is fishy also, as in log spectre is complaining on lack of dc path between net Vip and 0. Looks like some nets are floating for some reason. It might results with some strange conditions for model, what could end up with shorts.
- Make supply nets global
- add nodeset for your biasing circuit (startup circuit is working in transient, not in dc)
- and please attach full netlist
Hi, Dominik! Thank you for your reply. I have actually taken a look at the netlist and saw that the voltage at the gate of PM1, which is the plus input terminal of the opamp, is missing. Even though the voltage source remains on the schematic, it does not apper in the netlist even after recreating it from ADE Explorer window. I have also set the supply voltage to 1V, which I have tried to do before, it does not reduce the ammount of warnings in the log file and I do not see any significant difference between these two cases. I have also found high-performance simulation by going to SetUp in ADE Explorer->High-performance simulation and I see this window:There is something fishy.
If you could try fix the dimensions (Length and Width parameters does not help in netlist readability as they are forcing netlister to print all model conditional equations).
→ I am not sure if model is in proper w,l range.
The design is using 1V devices, while the VDD in netlist is set to 1.8V. If you would lower it to 1V.
There is only V0 source present in netlist, it means that gate of PM1 is floating. It might be also reduced to ground, but it is not clear. What voltage is suppose to be set on Vip net? If not 0, then try to set instance preservation to all (in GUI can be found in high-performance simulation → simply enable instance preservation and use * for all).
V0 source is trying to pull 65TA (tera!) of current, so circuit behaves as ideal short on voltage source. This current is then generating huge voltage drop on every resistance in the circuit and simulator is lost. It might be caused by:
Try to limit current by adding 1Ω resistor in series between V0 source and VDD! net.
- input to the model which is beyond it range (too small or too large dimensions)
- Vdd beyond range of model
- something else
Hi, dick_freebird and thank you for your reply! The thing is that me and other students have been working with this technology before and nobody faced any errors as far as I remember. I remember sucsesfully designing an opamp with gpdk090 even with 5V supply and not using any cascodes (which I guess is even worse in terms of "blowing up" the transistors since more voltage has to fall on an individual device between Vdd and gnd). The only difference for me now is (maybe) the version of the technology and cadence version (6.15 vs 6.17)These kinds of things are why I recommend that
OP spends the effort to validate the models given.
Especially, that a lonely transistor doesn't "blow up"
when terminal voltages are overranged.
I thought it might be possible that a 1V device
-would- blow up outside where anybody might've
looked.
You could try (say) making all devices 1.8V and
if that changes the outcome, maybe leads you
somewhere.
Back when I worked for a RFIC company I watched
Cadence and UC Berkeley bicker for months over
whose fault it was, that the BSIMSOI compact
model would "blow up" when our FDSOI "I type"
FETs reversed voltage. When voltage passed
through zero the FET code divided by zero.
Held up our switch design teams for months
while they played a blame game.
Trust? Can't trust the top dogs, with manpower
and money like mad. I'll be holding onto doubt
about academic teaching exercises and whether
they drive out all error before it gets to you.
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