Question on Electromigration

[Prasanna Kumar]

Hi,

How do we compare electromigration in submicron trechnology and deep submicron technology.

1. EM aoocurs both in Submicron as well as Deep Submicron , but the effects are adverse in DSM, How can we justify it.

eg : For Submicron Process I have a current of say 5milliamps to pass , i can use a 5um thick metal line,it can be done in the same way in the DSM also, but how do we justify that EM is more in DSM than Submicron process.

I would be great if some one explains this in ( detail please )

Thanks in advance.

 

[uncle_urfi]

Good article;
www.accoladeeng.com/memory_module_reliability_qualification.pdf

Search for EM; this is a concern area:
www.starc.jp/univ/joint/rm/rm2001-e.pdf

Electron-migration is the migration of electrons, when the wire is not big enough to handle the current density.

So as the technology sizes shrink, it is more likely that these effects will become pronounced because of the gates sizes, metal widths and other structures are shrinking in size.

But this can be minimized by careful layout and by recalculating the current density on critical interconnects.