There's "layers" to this.
At moderate, sustained reverse current charge trapping
from the hot carriers can degrade (particularly) low-current
beta and shift Vbe slightly. For a switching application
maybe neither of these matter much. But you'd like to be
within a decade or two (Ic) of peak beta operating point
in the "on" condition.
There will come a point where you do thermal damage
(like zener-zap programming) and this depends some
on current crowding, defects that break down early
and hog all the heat.
Vendors are going to sandbag any info they give, which
usually isn't much - especially for an operating region
which "should never happen".
You might need to test-to-fail some parts and apply a
safety factor that appeals to you, after you have a grasp
of populations and variations.