I first encountered this in the '80s, I inherited
a floundering chip design in a bipolar technology
which used PTAT loops as latches (analog guy
let to do digital design in a "10um node", it
failed, he left, I got my first "non-digital" job
in the linear group - they always let new
interns work the ER, right?).
What I found was that the simple PTAT loop,
comprising two current mirrors with gain and
the usual "corner resistor" had an additional
state besides "off" and "
@set-current" - if
driven into saturation of the BJT mirror-
master device (across high-ish natural Rc)
the mirror ratio swings wide and saturates
the other, and now it's a degenerate SCR
more or less, which the wimpy turnoff
switch device could not remove (headroom
low, trying to quench below Vce)sat while the
loop enjoys full supply headroom).
Turned out that the various current mirrors
(in bipolar technology) have different responses
when driven well past designed operating
point.
This attached is an excerpt from a short course
I made, illustrating the mechanism. I took it as
a broader lesson, than any current loop should
be checked out for behaviors beyond lock-in
and any potential to latch (you might find some
triggers in kink / impact ionization "drain curl"
in MOS circuits) and then mitigate. In my BJT
PTAT case, a sufficient value resistor between
the mirrors' legs was enough to return "turnoff
authority" to the reset switch.