Thanks for your suggestion. The reason for asking this is that as I read different papers, they give drastic different figures for contributions of noise.
The more I read the IEEE papers, the more unsure I am about the answer. In papers like "Tail Current Noise Suppression in RF CMOS VCOs", JSSC Vol 37 nos 3, current source is identified as the main culprit for noise while in papers like the one in [Hajimiri JSSC 01 Vol36], tail current noise source is very small. Maybe it is just the difference in optimization approach that yield such a great difference?