dsk635
Newbie level 4
![Newbie level 4](/styles/images/ranks/blevel1.gif)
Hi,
I have to find the variation in the output of my design when the vth0 parameter of the mos devices varies. I inserted the required DEV and LOT values in the models and tried doing a MC analysis. The problem I encounter is that each run is a DC analysis of the circuit where one of the model parameter is varied. Orcad pspice does not do the MC analysis in this case saying that one cannot do a MC analysis when the DC analysis sweeps a model parameter.
Is there a way to get around this limitation? Or any other version of spice which will do this?
Thanks,
-DSK
I have to find the variation in the output of my design when the vth0 parameter of the mos devices varies. I inserted the required DEV and LOT values in the models and tried doing a MC analysis. The problem I encounter is that each run is a DC analysis of the circuit where one of the model parameter is varied. Orcad pspice does not do the MC analysis in this case saying that one cannot do a MC analysis when the DC analysis sweeps a model parameter.
Is there a way to get around this limitation? Or any other version of spice which will do this?
Thanks,
-DSK