In the distant past when I had to grind numerous MC
analyses, I would put a transistor (or pair) of each type
in the top level schematic so that I could get at the
transistor attributes easily. In the simulator I used, you
could print the .MODEL params and the .OP device
attributes. Running with process variation on and
mismatch off, would give the process deviation. The
simulator had a repeatable pseudorandom behavior,
and if needed I could set MCCNT= and return to any
problem iteration at will. Dunno about HSPICE.