Is it possible to simulate mode conversion phenomenon induced on a differential pair by the variation of the dielectric constant (I use Ansys)

rdpdo2002

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Hello,

Just a question I have...

I would like to bring into play the mode conversion phenomenon induced on a differential pair by the variation of the dielectric constant on a FR4 for example. That is, creation of common mode insertion and return loss due to assymetries of the two lines due time delay variation because of epsilon variation.

Do you know if it is possible under Ansys HFSS to configure the dielectric constant by ensuring that it varies "spatially" by a certain percentage... A sort of stochastic dielectric constant, but with spatial variation ?

Or maybe this is possible in another way?

Or perhaps, is there other tools (like SIwave or others ... ??) wich can take it into account for SI analysis ??

Thanks you !
 

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