IC failure Analysis ( Latch-up )

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Hello

I have two chips. one has a latch-up problem and the others does not. but this chip is damaged-chip too(not latch-up damage. but cause is unknown)

I want to distinguish each other which one is latch-up damaged and the other is not. Is there is way to distinguish two damaged-chip?

thanks
 

If latchup has been left to run to its conclusion, you may
not be able to tell much. But a common clue is that the
supply interconnect is burnt. You may find a hot spot if
the latchup is due to an isolated lack of body ties / substrate
ties. But if the whole physical design is marginal the latchup
may be pervasive and the damage likewise.

I don't know why you assert that one is not latchup-damaged
when you say the cause is unknown.
 
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I want to tell confidently that latch-up is not the cause for "Unknown" damaged chip. I want to know "Unknown" damaged chip is damaged by some cause, not latch-up.

But I have no evidence for some other people.

But I don't know How to distinguish each other latch-up sample & unknown damaged sample.

If some chip is damaged by latch-up, how do I know that? through physical analysis? or any other way?

First of all, I'll prepare to physical analysize (de-layer). I wish this method let me know the difference between latchup sample and not-latchup sample.

thanks.
 
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