> To riddhi.kapasi
I'm sorry I don't have docs explaining that, but from experience:
- using only one clock for scan allows to avoid clock domains crossing for scan. Clock crossing can be generated by the ATPG tools, but make analysis more complicated when facing a problem.
- you don't have to worry about the tester. Some tester (especially the old ones) support only a limited number of different clocks (number of generator is limited).
- during CTS, optimization is faster and easier (means you'll get better results) with few clocks. For normal operation you probably need several clocks, so it might not be necessary to increase the number of scan clocks. Some tools (for eg. Aprisa) use parallel optimization. So it's better to try to reduce the clock number when possible.
One clock for scan is not a "must", but I would say it makes design easier.
On the other hand I agree that using several clock also have advantages. Especially if you use at-speed test (it's becoming a must for high integration SoC using nanometer process).
Hopes it answer some of your questions.