BMR
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Hello ,
I am supposed to compare the measured S parameter data and the simulated S parameter for a discrete LDMOS power transistor package which has 2 die in it.
Based on the previous experience I know there will be some deviations between both the results as it's always obvious. But in this case I see oscillation only at a particular frequency in the measured data. I ran all stability analysis in the simulation and it did not even show tiny variation. So I am confused as to how to go about this. Thanks
I am supposed to compare the measured S parameter data and the simulated S parameter for a discrete LDMOS power transistor package which has 2 die in it.
Based on the previous experience I know there will be some deviations between both the results as it's always obvious. But in this case I see oscillation only at a particular frequency in the measured data. I ran all stability analysis in the simulation and it did not even show tiny variation. So I am confused as to how to go about this. Thanks