[DFT] IDDQ Testing Fault Coverage

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The IDDQ target is to cover maximum no of states for each logic gate in given design. we no need to observe any fault outside.
Hence is just a toggle profile. due to these reasons the IDDQ coverage is high with lesser patterns.
 

rameshsuthapalli said:
The IDDQ target is to cover maximum no of states for each logic gate in given design. we no need to observe any fault outside.
Hence is just a toggle profile. due to these reasons the IDDQ coverage is high with lesser patterns.
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Thanks for Reply.
But I am thinking that We have only 1 observe point. and that is ground or may be Power Supply current.
So is it true that we have only 1 current measure point i.e. Ground/VDD?
Pl correct me if anything wrong.
If only 1 current measuring pont thn we can detect only single fault with the single pattern.
Is it also true or not?
 

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