Yes. You can apply Stuck-At patterns for IDDQ but you can not apply Stuck-At patterns to Transition.
In transition fault, we have to do transition in the same pattern. Its generally like : Scan - in, launch(launching the transition), capture and shift out where in stuck-at shift-in,capture and shift-out only.
To use Stuck at as a IDDQ is not simple task, because in IDDQ we are measuring current at the VDD/VSS pins. But Stuck-at patterns are measuring the voltage at Scan out pins. We have to do conversion.
2nd thing is that , generally design have a high stuck at pattern count but all can not apply for IDDQ. So we have to do select some patterns for IDDQ from so many stuck at patterns.
Regards,
Maulin