srirao
Newbie
Hello Experts ,
I've design with 9 Scan chains - including TDI-TDO being one of them. When I set jtag_RST pin as -TI in the pin assign as test_function, everything works fine while generating the patterns.
But for the design, at top level during Si checkout, the pin jtag_RST = 1 . So the pattern generated with -TI are not working. [ seeing mismatches]
When I changed the test_function for this pin to be +TI or +SC,+TC; create test fails - in the sense the coverage is at 0% as controllability on the chains are lost.
WITH jtag_RST being set as +TI using test_function :
There are 1 controllable scan chains fed by Scan In (SI) primary inputs.
There are 9 observable scan chains feeding to Scan Out (SO) primary outputs.
There are 0 controllable scan chains fed by on-product Pattern Generator(s).
There are 0 observable scan chains feeding to on-product Multiple-Input Signature Register
How to debug this issue? what could be reason for the scan chains to be only observable and not controllable?
I've design with 9 Scan chains - including TDI-TDO being one of them. When I set jtag_RST pin as -TI in the pin assign as test_function, everything works fine while generating the patterns.
But for the design, at top level during Si checkout, the pin jtag_RST = 1 . So the pattern generated with -TI are not working. [ seeing mismatches]
When I changed the test_function for this pin to be +TI or +SC,+TC; create test fails - in the sense the coverage is at 0% as controllability on the chains are lost.
WITH jtag_RST being set as +TI using test_function :
There are 1 controllable scan chains fed by Scan In (SI) primary inputs.
There are 9 observable scan chains feeding to Scan Out (SO) primary outputs.
There are 0 controllable scan chains fed by on-product Pattern Generator(s).
There are 0 observable scan chains feeding to on-product Multiple-Input Signature Register
How to debug this issue? what could be reason for the scan chains to be only observable and not controllable?