vector scan sequence
In order to test the manufactured design, the scan-chain method is often used.
Because the objective of scan-chain circuits is mainly to test the combinational logic between Flip Flops, the necessities to scan the stimuli to the inputs of the combinationa logic is required; however since the utility of scan-chain methods is to reduce the number of pins of the chip; therefore the serial method is always taken so that the scan clock should be utilized to transfer the serial stimuli into the parallel ones. Even if not, in order to test the large number of cones between the Flip flops, we can only test one of the cones at a time so that a scan clock is needed. Currently, there are two ways to test the function of the combinational logics: internal testing logic such as BSIT and external devices such as ATE which often is expensive and less tesing pins than the pins on the chip.