Welcome to our site! EDAboard.com is an international Electronics Discussion Forum focused on EDA software, circuits, schematics, books, theory, papers, asic, pld, 8051, DSP, Network, RF, Analog Design, PCB, Service Manuals... and a whole lot more! To participate you need to register. Registration is free. Click here to register now.
You can have corners and monte-carlo for process as well as mismatch!
Yield is typical simulated by monte-carlo. Corner simulation verify if your circuit work up to specification in an unlikely process parameter corner.
The same approach is applicable to process mismatch. You can have a corner made of an individual instance or vary all relevant instances at all by distributions.
But I don't understand the last one.
I never run monte-carlo simulation at corners because this is not realistic at all. Can you please explain in a better way if I'm wrong ?
This site uses cookies to help personalise content, tailor your experience and to keep you logged in if you register.
By continuing to use this site, you are consenting to our use of cookies.
