gszczesz
Full Member level 2
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I need to obtain some quasi-quantitative estimate of mismatch of a PMOS/NMOS with very low current densities, suspected to be in subthreshold.
I know sub-threshold operation degrades mismatch, but I've never seen quantitative measures. Anyone know how bad it gets, or how to estimate it (rule-of-thumbs are o.k.)?
As a bonus, does anyone know how sub-threshold is sensitive to time + temperature?
Greg
I know sub-threshold operation degrades mismatch, but I've never seen quantitative measures. Anyone know how bad it gets, or how to estimate it (rule-of-thumbs are o.k.)?
As a bonus, does anyone know how sub-threshold is sensitive to time + temperature?
Greg