Continue to Site

Welcome to EDAboard.com

Welcome to our site! EDAboard.com is an international Electronics Discussion Forum focused on EDA software, circuits, schematics, books, theory, papers, asic, pld, 8051, DSP, Network, RF, Analog Design, PCB, Service Manuals... and a whole lot more! To participate you need to register. Registration is free. Click here to register now.

DFT implementation and verification

Status
Not open for further replies.

preethi19

Full Member level 5
Full Member level 5
Joined
Jun 30, 2014
Messages
273
Helped
0
Reputation
0
Reaction score
1
Trophy points
16
Activity points
3,474
Hi can anyone explain me what exactly is DFT (Design For Test) implementation and verification in digital design??? Thank you!!! :)
 

Hi preethi19,

DFT implementation
- To implement DFT for digital design, the DFT compiler (Synopsys) will replace the normal registers by the scan registers (the regiter with 2 inputs: D and TI). Then, DFT compiler will create scan chains from all registers, to control the value of all output pins (Q) of all registers.

DFT verification
- To verify DFT circuit, we use the tool Tetramax (Synopsys) to generate automatically test patterns. These patterns can check the stuck-at-fault violations in any nets of the digital designs.
 
Hi,

In genneral, DFT Implemenation is to insert a DFT circuit upon a gate level design.
This step including:
- Convert normal Flops to Scan-Flops. ( in some special cases, a Flops could be non-scan one )
- Connect those Scan-Flops into number of chains, called scan-chain.
The number of scan-chain and the number of Flop per scan-chain will be depends on Test technique/EDA that you want to apply.
- Number of scan-chain normally very huge comapre with design Port, hence, they are compressed and decompressed. This logic also inserted by some DFT EDA tools.
- To control the operation of DFT, a control logic also be insert to origial gate level design. It works in Test mode only.

DFT verification:
- Verify the correctness in function of Flops and Standard cells via scan patterns.
- Pattern will be genarated by EDA tool automatically. Patterns will be shifted into scan-chain.
- Capture the output of scan-chain and compare with expected value.
- The pattern then will be used to check on silicon device after fabrication. We can eliminate the fail one here.
 
Status
Not open for further replies.

Part and Inventory Search

Welcome to EDABoard.com

Sponsor

Back
Top